Millimeter-wave open resonator-based dielectric characterization of printed circuit boards
Author:
Affiliation:
1. Graphic Era (Deemed to be University),Department of Electronics and Communication Engineering,Dehradun,India
2. Indian Institute of Technology,Department of Electronics and Communication Engineering,Roorkee,India
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10242785/10242796/10242894.pdf?arnumber=10242894
Reference16 articles.
1. Dielectric Measurements of Millimeter-Wave Materials
2. The Essence of Dielectric Waveguides
3. Attenuation measurement of very low loss dielectric waveguides by the cavity resonator method applicable in the millimeter/submillimeter wavelength range
4. Measurements of the Complex Permittivity of Low Loss Polymers at Frequency Range From 5 GHz to 50 GHz
5. Millimeter-Wave Dielectric Properties of Highly Refractive Single Crystals Characterized by Waveguide Cavity Resonance
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