Efficient Test Compression Configuration Selection-Reference-Cited by-同舟云学术

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Efficient Test Compression Configuration Selection

Published:2021 Issue: Volume: Page:1-1
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Ye Chong-Siao,Zheng Shi-Xuan,Tsai Fong-Jyun,Wang Chen,Lee Kuen-Jong,Cheng Wu-Tung,Reddy Sudhakar M.,Zawada Justyna,Kassab Mark,Rajski Janusz

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/6917053/09493741.pdf?arnumber=9493741

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Revisiting Test Compression Configuration in Context of Multi-Core Testing Using Packetized Scan Network;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06

2. Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations;2022 IEEE 40th VLSI Test Symposium (VTS);2022-04-25

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