EM SCA White-Box Analysis-Based Reduced Leakage Cell Design and Presilicon Evaluation-Reference-Cited by-同舟云学术

EM SCA White-Box Analysis-Based Reduced Leakage Cell Design and Presilicon Evaluation

Published:2022-11 Issue:11 Volume:41 Page:4927-4938
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Das Debayan¹^ORCID,Nath Mayukh¹^ORCID,Chatterjee Baibhab¹^ORCID,Kumar Raghavan²^ORCID,Liu Xiaosen²^ORCID,Krishnamurthy Harish²^ORCID,Sastry Manoj³,Mathew Sanu²^ORCID,Ghosh Santosh³,Sen Shreyas¹^ORCID

Affiliation:

1. School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA

2. Circuit Research Lab, Intel Labs, Hillsboro, OR, USA

3. Security and Privacy Research, Intel Labs, Hillsboro, OR, USA

Funder

National Science Foundation

Intel Corporation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

https://ieeexplore.ieee.org/ielam/43/9928799/9684545-aam.pdf

Reference34 articles.

1. DRAM Device Organization: Basic Circuits and Architecture

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3. Architecture Correlation Analysis (ACA): Identifying the Source of Side-channel Leakage at Gate-level

4. Karna: A Gate-Sizing based Security Aware EDA Flow for Improved Power Side-Channel Attack Protection

5. A 10nm high performance and low-power CMOS technology featuring $3^{rd}$ generation FinFET transistors, self-aligned quad patterning, contact over active gate and cobalt local interconnects;auth;Proc IEEE Int Electron Devices Meeting (IEDM),2017

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2. Silicon-correlated Simulation Methodology of EM Side-channel Leakage Analysis;ACM Journal on Emerging Technologies in Computing Systems;2022-12-09

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