Analytical Placement Considering the Electron-Beam Fogging Effect-Reference-Cited by-同舟云学术

Analytical Placement Considering the Electron-Beam Fogging Effect

Published:2021-03 Issue:3 Volume:40 Page:560-573
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Chen Jianli¹^ORCID,Chang Yao-Wen²^ORCID,Huang Yu-Chen³

Affiliation:

1. State Key Laboratory of ASIC and System, Fudan University, Shanghai, China

2. Department of Electrical Engineering, Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan

3. Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan

Funder

Fujian Science Fund for Distinguished Young Scholars

National Science Foundation of China

AnaGlobe, IBM, MediaTek, TSMC, and MOST of Taiwan

NTU

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

4. Novel Proximal Group ADMM for Placement Considering Fogging and Proximity Effects;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-12

5. Fogging-Effect-Aware Mixed-Signal IC Placement with Reinforcement Learning;2022 IEEE International Symposium on Circuits and Systems (ISCAS);2022-05-28