Analyzing and Patching SPEKE in ISO/IEC

Author:

Hao FengORCID,Metere Roberto,Shahandashti Siamak F.ORCID,Dong ChangyuORCID

Funder

ERC

EPSRC

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computer Networks and Communications,Safety, Risk, Reliability and Quality

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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