Defect Modeling During the SLM Process for Manufacturing Microwave Devices-Reference-Cited by-同舟云学术

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Defect Modeling During the SLM Process for Manufacturing Microwave Devices

Published:2023-10-25 Issue: Volume: Page:412-416
ISSN:
Container-title:2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
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Author:

Li Shuai¹,Bao Xiue¹,Gugliandolo Giovanni²,Yuan Haoyun¹,Li Jinkai³,Shao Linxiang¹,Du Minghe³,Donato Nicola²,Marinkovic Zlatica⁴,Crupi Giovanni⁵,Fang Lili¹,Si Liming¹,Sun Houjun¹

Affiliation:

1. School of Integrated Circuits and Electronics, Beijing Institute of Technology,Beijing,China,100081

2. University of Messina,Engineering Department,Messina,Italy,98166

3. Tangshan Research Institute of BIT,Tangshan,China,063000

4. University of Niš,Faculty of Electronic Engineering,Niš,Serbia

5. University of Messina,BIOMORF Department,Messina,Italy,98125

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10405419/10405547/10405715.pdf?arnumber=10405715

Reference10 articles.

1. 3D Printing of Microwave and Millimeter-Wave Filters: Additive Manufacturing Technologies Applied in the Development of High-Performance Filters with Novel Topologies

2. 3D Printed Antennas for 5G Communication: Current Progress and Future Challenges

3. A Critical Review on Recent Research Methodologies in Additive Manufacturing

4. H-DenseUNet: Hybrid Densely Connected UNet for Liver and Tumor Segmentation From CT Volumes

5. Vision-based melt pool monitoring for wire-arc additive manufacturing using deep learning method

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