Author:
Ko Yen-Chun,Huang Shih-Hsu
Cited by
3 articles.
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1. An Efficient Grouping Algorithm with Build-in-Self-Test for Multiple Memories;2024 2nd International Symposium of Electronics Design Automation (ISEDA);2024-05-10
2. On Managing Test-Time, Power, and Layer Assignment in 3D SoCs with Built-In-Self-Repair Modules;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
3. Test Methodology Automation for Multi-Die Package Realization;2022 IEEE International Test Conference India (ITC India);2022-07-24