An Improved Through-Only De-Embedding Method for 110-GHz On-Wafer RF Device Characterization
Author:
Affiliation:
1. School of Integrated Circuits, Tsinghua University, Beijing, China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics
Link
http://xplorestaging.ieee.org/ielx7/7260/9913288/09776513.pdf?arnumber=9776513
Reference16 articles.
1. An Improved Millimeter-Wave General Cascade De-Embedding Method for 110 GHz On-Wafer Transistor Measurements
2. A Distributed De-Embedding Solution for CMOS mm-Wave On-Wafer Measurements Based-on Double Open-Short Technique
3. Analysis of the parameter extraction for on-chip transmission lines
4. A simple through-only de-embedding method for on-wafer S-parameter measurements up to 110 GHz;ito;IEEE MTT-S Int Microw Symp Dig,2008
5. 1-Thru Deembedding Method for One-Port Microwave Device Characterization
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