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On the Robustness of Average Losses for Partial-Label Learning

  • Published:2023 Issue: Volume: Page:1-15
  • ISSN:0162-8828
  • Container-title:IEEE Transactions on Pattern Analysis and Machine Intelligence
  • language:
  • Short-container-title:IEEE Trans. Pattern Anal. Mach. Intell.

Author:

Lv Jiaqi1ORCID,Liu Biao2,Feng Lei3ORCID,Xu Ning2ORCID,Xu Miao4,An Bo3ORCID,Niu Gang1ORCID,Geng Xin2ORCID,Sugiyama Masashi1ORCID

Affiliation:

1. RIKEN Center for Advanced Intelligence Project

2. School of Computer Science and Engineering, Southeast University, Bangladesh

3. School of Computer Science and Engineering, Nanyang Technological University, Singapore

4. School of Information Technology and Electrical EngineeringThe University of Queensland

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Applied Mathematics,Artificial Intelligence,Computational Theory and Mathematics,Computer Vision and Pattern Recognition,Software

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