PLMP – Point-Line Minimal Problems in Complete Multi-View Visibility-Reference-Cited by-同舟云学术

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PLMP – Point-Line Minimal Problems in Complete Multi-View Visibility

Published:2024-01 Issue:1 Volume:46 Page:421-435
ISSN:0162-8828
Container-title:IEEE Transactions on Pattern Analysis and Machine Intelligence
language:
Short-container-title:IEEE Trans. Pattern Anal. Mach. Intell.

Author:

Duff Timothy¹^ORCID,Kohn Kathlén²^ORCID,Leykin Anton³^ORCID,Pajdla Tomas⁴^ORCID

Affiliation:

1. Department of Mathematics, University of Washington, Seattle, WA, USA

2. KTH Royal Institute of Technology, Stockholm, Sweden

3. School of Mathematics, Georgia Tech, Atlanta, GA, USA

4. Czech Institute of Informatics, Robotics and Cybernetics, Czech Technical University, Prague, Czechia

Funder

National Science Foundation

NSF Mathematical Sciences Postdoctoral Reserarch Fellowship

Knut och Alice Wallenbergs Stiftelse

EU Regional Development Fund IMPACT

SPRING

ICERM

Simons Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Applied Mathematics,Artificial Intelligence,Computational Theory and Mathematics,Computer Vision and Pattern Recognition,Software

Link

https://ieeexplore.ieee.org/ielam/34/10345401/10286103-aam.pdf

Reference84 articles.

1. An Efficient Minimal Solution for Multi-camera Motion

2. Efficient Solvers for Minimal Problems by Syzygy-Based Reduction

3. A minimal solution to the rolling shutter pose estimation problem

4. Rank Conditions on the Multiple-View Matrix

5. Robust and Accurate Line- and/or Point-Based Pose Estimation without Manhattan Assumptions

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