Author:
Veeravalli Varadan Savulimedu,Steininger Andreas
Cited by
2 articles.
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1. High-Resolution Single Event Transient Measurement Circuit with Low Area Cost;2021 IEEE 3rd International Conference on Circuits and Systems (ICCS);2021-10-29
2. Setup for an Experimental Study of Radiation Effects in 65nm CMOS;2017 Euromicro Conference on Digital System Design (DSD);2017-08