Utilization of Impedance Disparity Incurred from Switching Activities to Monitor and Characterize Firmware Activities
Author:
Affiliation:
1. Florida International University,ECE Department,Miami,Florida,USA
2. Weber State University,ECE Department,Ogden,Utah,USA
Funder
National Science Foundation
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10014680/10014704/10014924.pdf?arnumber=10014924
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