Automated Transfer Learning Model for Counterfeit IC Detection-Reference-Cited by-同舟云学术

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Automated Transfer Learning Model for Counterfeit IC Detection

Published:2022-10-25 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE Physical Assurance and Inspection of Electronics (PAINE)
language:
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Author:

Bhure Chaitanya Mukund¹,Nicholas Geraldine Shirley¹,Ghosh Shajib²,Zhong Yadi³,Saqib Fareena¹

Affiliation:

1. University of North Carolina at Charlotte,Dept. of Electrical and Computer Engineering,Charlotte,USA

2. University of Florida,Dept. of Electrical and Computer Engineering,Gainesville,USA

3. Auburn University,Dept. of Electrical and Computer Engineering,Auburn,USA

Funder

National Science Foundation

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10014680/10014704/10014980.pdf?arnumber=10014980

Reference28 articles.

1. Counterfeit IC Detection By Image Texture Analysis

2. A novel algorithm of IC defect images enhancement based on histogram equalization and IHS transform

3. IC Image Segmentation Using Eigenvalue Clustering

4. A Delay-Based Machine Learning Model for DMA Attack Mitigation;yutian;Cryptography,2021

5. Automated detection of counterfeit ICs using machine learning

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Evaluating a Multimodal, Non-Destructive Approach Combining a Resonant Cavity System and Infrared Spectroscopy to Detect Counterfeit and Anomalous Integrated Circuits;IEEE Transactions on Components, Packaging and Manufacturing Technology;2024-07

2. AutoDetect: Novel Autoencoding Architecture for Counterfeit IC Detection;Journal of Hardware and Systems Security;2024-05-23

3. $\text{IED}_{\text{PUF}}$ Probe: A PUF-Based Hardware Fingerprint Extraction Equipment for IEDs;2023 IEEE Physical Assurance and Inspection of Electronics (PAINE);2023-10-24

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