Electrical Treeing Breakdown Voltage of Epoxy/Hollow-silica Nanocomposites-Reference-Cited by-同舟云学术

Electrical Treeing Breakdown Voltage of Epoxy/Hollow-silica Nanocomposites

Published:2021-12-12 Issue: Volume: Page:
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Container-title:2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
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Author:

Shimura Mirai¹,Kurimoto Muneaki¹,Sugimoto Shigeyuki¹,Kato Takeyoshi¹,Tagawa Kazuma¹,Suzuoki Yasuo²

Affiliation:

1. Nagoya University,Furo-cho, Chikusa-ku, Nagoya,Japan,464-8603

2. Aichi Institute of Technology,Yachigusa, Yakusa-cho, Toyota,Japan,470-0392

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9705287/9705312/09705414.pdf?arnumber=9705414

Reference13 articles.

1. Evaluation of AC Breakdown Voltage of Epoxy / Hollow-silica Nanocomposites using a Needle-Plane electrode system;shimura;Annual Conference of Fundamentals and Materials Society IEE Japan,2020

2. Effect of Filling Ratio on Treeing Breakdown of Epoxy/Hollow Silica Nanocomposites;shimura;Tokai-Section Joint Conference on Electrical Electronics Information and Related Engineering,2020

3. Preparation and insulation properties of epoxy-layered silicate nanocomposite

4. Voltage Endurance Characteristics of Eppoxy/Silica Nanocomposites;iizuka;Annual Conference of Fundamentals and Materials Society IEE Japan,2009

5. Application of functionally graded material for reducing electric field on electrode and spacer interface

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