A Fully-Digital Variation-Tolerant Runtime Detector for PCB-Level Probing Attack in a 28-nm CMOS
Author:
Affiliation:
1. Department of Electrical Engineering, Columbia University, New York, NY, USA
2. Department of Micro-Nano Electronics, Shanghai Jiao-Tong University, Shanghai, China
3. Intel Labs, Intel Corporation Hillsboro, Hillsboro, OR, USA
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/8011414/10016898/10234573.pdf?arnumber=10234573
Reference9 articles.
1. Runtime Detection of Probing/Tampering on Interconnecting Buses
2. Physical Attack Protection Techniques for IC Chip Level Hardware Security
3. A method for detecting DRAM bus tampering;oksman,2020
4. EQZ-LDO: A Near-Zero EDP Overhead, >10M-Attack-Resilient, Secure Digital LDO featuring Attack-Detection and Detection-Driven Protection for a Correlation-Power-Analysis-Resilient IoT Device
5. Taking DMA attacks to the next level;trikalinou,0
Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. 16.6 PACTOR: A Variation-Tolerant Probing-Attack Detector for a 2.5Gb/s×4-Channel Chip-to-Chip Interface in 28nm CMOS;2024 IEEE International Solid-State Circuits Conference (ISSCC);2024-02-18
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