Highly Reliable Depletion-Mode a-IGZO TFT Gate Driver Circuits for High-Frequency Display Applications Under Light Illumination-Reference-Cited by-同舟云学术

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Highly Reliable Depletion-Mode a-IGZO TFT Gate Driver Circuits for High-Frequency Display Applications Under Light Illumination

Published:2012-04 Issue:4 Volume:33 Page:528-530
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Kim Binn,Cho Hyung Nyuck,Choi Woo Seok,Kuk Seung-Hee,Jang Yong Ho,Yoo Juhn-Suk,Yoon Soo Young,Jun Myungchul,Hwang Yong-Kee,Han Min-Koo

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/6172299/06151011.pdf?arnumber=6151011

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Review of Integrated Gate Driver Circuits in Active Matrix Thin-Film Transistor Display Panels;Micromachines;2024-06-25

2. Active Matrix Resistive Sensor Array With Reduced Dependence on TFT Channel Resistance;IEEE Sensors Letters;2023-09

3. A 50 dB high-gain operational amplifier integrated with metal-oxide TFTs;Semiconductor Science and Technology;2022-09-06

4. P‐10: Emit Signals Reused Gate Driver Design for Ultra‐Narrow‐Bezel Micro‐LED Display Based on Metal‐Oxide TFTs;SID Symposium Digest of Technical Papers;2022-06

5. Amorphous IGZO Thin-Film Transistor Gate Driver in Array for Ultra-Narrow Border Displays;IEEE Journal of the Electron Devices Society;2022

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