Evaluating the Robustness of SRAM Physical Unclonable Functions: Empirical Investigations-Reference-Cited by-同舟云学术

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Evaluating the Robustness of SRAM Physical Unclonable Functions: Empirical Investigations

Published:2023-10-24 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE Physical Assurance and Inspection of Electronics (PAINE)
language:
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Author:

Singh Harshdeep¹,Bhatta Niraj Prasad¹,Tawsik Jawad K M¹,Ghimire Ashutosh¹,Rahman MD Tauhidur²,Amsaad Fathi¹

Affiliation:

1. Computer Science and Engineering, Wright State University,Dayton,United states of America

2. Electrical and Computer Engineering, Florida International University,Miami,United states of America

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10317939/10317942/10317983.pdf?arnumber=10317983

Reference18 articles.

1. Systematic Correlation and Cell Neighborhood Analysis of SRAM PUF for Robust and Unique Key Generation

2. Modeling Static Noise Margin for FinFET based SRAM PUFs

3. FPGA based device specific key generation method using Physically Uncloanble Functions and neural networks

4. A zero-cost approach to detect recycled SoC chips using embedded SRAM

5. Reliability analysis of finfet-based sram pufs for 16nm, 14nm, and 7nm technology nodes;masoumian;2022 Design Automation & Test in Europe Conference & Exhibition (DATE),0

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analyzing Aging Effects on SRAM PUFs: Implications for Security and Reliability;Journal of Hardware and Systems Security;2024-07-27

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