Attest: Non-Destructive Identification of Counterfeit FPGA Devices-Reference-Cited by-同舟云学术

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Attest: Non-Destructive Identification of Counterfeit FPGA Devices

Published:2023-10-24 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE Physical Assurance and Inspection of Electronics (PAINE)
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Author:

Batchelor Whitney¹,Koiner James¹,Crofford Cody¹,Paar Kevin¹,Winslow Margaret¹,Taylor Mia¹,Harper Scott¹

Affiliation:

1. Graf Research Corporation,Blacksburg,Virginia,USA

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10317939/10317942/10317967.pdf?arnumber=10317967

Reference10 articles.

1. Combating Counterfeit Components in the DoD Supply Chain;wagner;DSIAC,0

2. Big Data Analytics in VLSI Design Automation and Test;wang;Tutorial National Tsing-Hua University,2015

3. Machine Learning in Formal Verification FMCAD 2016 Tutorial Manish Pandey;PhD Chief Architect New Technologies Synopsys Inc,0

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