Author:
Yanfeng Ji ,Jianchen Hu ,Lanza Mario
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Mechanical Engineering
Cited by
6 articles.
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1. Effect of O2− Migration in Pt/HfO2/Ti/Pt Structure;Resistive Switching: Oxide Materials, Mechanisms, Devices and Operations;2021-10-16
2. Emerging Scanning Probe–Based Setups for Advanced Nanoelectronic Research;Advanced Functional Materials;2019-08-20
3. Effect of O2- migration in Pt/HfO2/Ti/Pt structure;Journal of Electroceramics;2017-04-01
4. A Fabrication Process for Emerging Nanoelectronic Devices Based on Oxide Tunnel Junctions;Journal of Nanomaterials;2017
5. Effects of aging on nanoscale planar metal-insulator-metal tunnel junctions;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2016-11