Application of Image Processing to Characterize Patterning Noise in Self-Assembled Nano-Masks for Bit-Patterned Media-Reference-Cited by-同舟云学术

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Application of Image Processing to Characterize Patterning Noise in Self-Assembled Nano-Masks for Bit-Patterned Media

Published:2009-10 Issue:10 Volume:45 Page:3523-3526
ISSN:0018-9464
Container-title:IEEE Transactions on Magnetics
language:
Short-container-title:IEEE Trans. Magn.

Author:

Nabavi S.,Vijaya Kumar B.V.K.,Bain J.A.,Hogg C.,Majetich S.A.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/20/5256997/05257128.pdf?arnumber=5257128

Cited by 46 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Using Long Short-Term Memory to Estimate the 2-D Interference of Bit-Patterned Media Recording Systems;IEEE Transactions on Magnetics;2024-09

2. Underwater image enhancement using contrast correction;Expert Systems;2024-08-26

3. Two-Dimensional 15/24 Non-Isolated Patterned Modulation Codes With Minimum Hamming Distance 3 in Bit-Patterned Media Recording;IEEE Access;2024

4. Design of Non-Isolated Modulation Code With Minimum Hamming Distance of 3 for Bit-Patterned Media-Recording Systems;IEEE Transactions on Magnetics;2023-11

5. Track Mis-Registration Estimator Based on K-Means Algorithm for Bit-Patterned Media Recording;IEEE Transactions on Magnetics;2023-03

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