Deep Learning for Semiconductor Defect Classification
Author:
Affiliation:
1. Ulster University,School of Computing, Engineering and Intelligent Systems,Londonderry,Northern Ireland
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9975846/9976066/09976162.pdf?arnumber=9976162
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1. P‐241: Late‐News Poster: A Study on the Tramsferable Functional Film of Mini LED / Micro LED Chip;SID Symposium Digest of Technical Papers;2024-06
2. Deep Learning-Based Visual Recognition for Inline Defects in Production of Semiconductors;IEEE Journal of Emerging and Selected Topics in Industrial Electronics;2024-01
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