Switching and Morphological Studies on Si15Te80Cu5 Glass and Thin Film
Author:
Affiliation:
1. CMR Institute of Technology,Department of EEE,Bengaluru,India
2. BMS College of Engineering,Department of EEE,Bengaluru,India
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10028980/10028739/10029089.pdf?arnumber=10029089
Reference19 articles.
1. Current status of the phase change memory and its future
2. Reversible electrical switching phenomena in disordered structures;ovshinky;Phys Rev Lett,1968
3. Electrical switching and crystalline peak studies on Si20Te80−xSnx (1 ≤ x ≤ 7) chalcogenide bulk glasses
4. Bit Cost Scalable Technology with Punch and Plug Process for Ultra High Density Flash Memory
5. Thermal disturbance and its impact on reliability of phase-change memory studied by the micro-thermal stage
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