Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
16 articles.
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1. Storage-Based Logic Built-In Self-Test with Variable-Length Test Data;2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2022-10-19
2. An improved zig zag approach for competitive group testing;Discrete Optimization;2022-02
3. Adaptive Graph-Constrained Group Testing;IEEE Transactions on Signal Processing;2022
4. Group Testing: An Information
Theory Perspective;Foundations and Trends® in Communications and Information Theory;2019
5. Fast Online Diagnosis and Recovery of Reconfigurable Logic Fabrics Using Design Disjunction;IEEE Transactions on Computers;2016-10-01