On a Generalized Framework for Modeling the Effects of Process Variations on Circuit Delay Performance Using Response Surface Methodology-Reference-Cited by-同舟云学术

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On a Generalized Framework for Modeling the Effects of Process Variations on Circuit Delay Performance Using Response Surface Methodology

Published:2007-03 Issue:3 Volume:26 Page:606-614
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Harish B. P.,Bhat Navakanta,Patil Mahesh B.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx5/43/4100744/04100752.pdf?arnumber=4100752

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Domain-Constrained Metamodels for Expedited Robust Design of Compact Microwave Components;2021 IEEE MTT-S International Microwave Symposium (IMS);2021-06-07

3. Reliability Challenges in FinFETs;Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs;2021

4. Accurate Leakage/Delay Estimation for FinFET Standard Cells under PVT Variations using the Response Surface Methodology;ACM Journal on Emerging Technologies in Computing Systems;2014-11-18

5. Hierarchical statistical analysis of complex analog and mixed-signal systems;International Journal of Electronics;2014-02-24

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