Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
19 articles.
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1. An Accelerating Technique for SAT-based ATPG;IPSJ Transactions on System LSI Design Methodology;2017
2. Automatic Test Pattern Generation;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14
3. The Test Pattern Generation for Digital Integrated Circuits Based on CA-IA-PSO Algorithm;2015 Seventh International Conference on Measuring Technology and Mechatronics Automation;2015-06
4. A Two-Variable Model for SAT-Based ATPG;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2013-12
5. Efficient Data Structures and Methodologies for SAT-Based ATPG Providing High Fault Coverage in Industrial Application;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2011-09