Constraint-Driven Test Scheduling for NoC-Based Systems-Reference-Cited by-同舟云学术

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Constraint-Driven Test Scheduling for NoC-Based Systems

Published:2006-11 Issue:11 Volume:25 Page:2465-2478
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Cota E.,Liu C.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx5/43/36103/01715430.pdf?arnumber=1715430

Cited by 30 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Parallel Software-Based Self-Testing with Bounded Model Checking for Kilo-Core Networks-on-Chip;Journal of Computer Science and Technology;2023-03-30

2. Software-based online self-testing using bounded model checking for 3D network-on-chips;Journal of Physics: Conference Series;2021-04-01

3. Wrapper scan chain design algorithm for testing of embedded cores based on chaotic dragonfly algorithm;Evolutionary Intelligence;2020-10-22

4. ILP Based Power-Aware Test Time Reduction Using On-Chip Clocking in NoC Based SoC;Journal of Low Power Electronics and Applications;2019-06-17

5. Fault-Tolerant Unicast-Based Multicast for Reliable Network-on-Chip Testing;ACM Transactions on Design Automation of Electronic Systems;2018-12-21

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