Author:
Takahashi H.,Keller K.J.,Le K.T.,Saluja K.K.,Takamatsu Y.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
11 articles.
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1. An Automatic Test Generation Method for Crosstalk Delay Faults Using Modified FAN Algorithm;Test Generation of Crosstalk Delay Faults in VLSI Circuits;2018-09-21
2. Introduction;Test Generation of Crosstalk Delay Faults in VLSI Circuits;2018-09-21
3. Fuzzy delay model based fault simulator for crosstalk delay fault test generation in asynchronous sequential circuits;Sadhana;2015-01-23
4. Cross-Talk Delay Fault Test Generation;Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems;2014-07-17
5. Observability-aware Directed Test Generation for Soft Errors and Crosstalk Faults;2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems;2013-01