Application of a cryogenic vector network measuring technique in a high-speed digital test-Reference-Cited by-同舟云学术

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Application of a cryogenic vector network measuring technique in a high-speed digital test

Published:1999-06 Issue:2 Volume:9 Page:3845-3849
ISSN:1051-8223
Container-title:IEEE Transactions on Appiled Superconductivity
language:
Short-container-title:IEEE Trans. Appl. Supercond.

Author:

Shimaoka K.,Nemoto M.,Tokunaga S.,Yoshida I.,Fujimaki A.,Hayakawa H.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/77/17000/00783866.pdf?arnumber=783866

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-speed bit-error-rate measurement system for high-temperature superconducting digital circuits;IEEE Transactions on Appiled Superconductivity;2003-12

2. Improvement of a bit error rate measuring system for high-temperature superconducting circuits;IEEE Transactions on Appiled Superconductivity;2003-06

3. Bit error rate measurement of a high-speed small-voltage signal using a superconducting transmission line;IEEE Transactions on Appiled Superconductivity;2001-03

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