Reliability testing of GaAs MMICs-Reference-Cited by-同舟云学术

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Reliability testing of GaAs MMICs

Published: Issue: Volume: Page:
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Container-title:Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits
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Author:

Anderson W.T.,Roussos J.A.,Christianson K.A.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx2/3504/10430/00487616.pdf?arnumber=487616

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Reliability Estimation of an Active Array Antenna Element for Space-Borne Synthetic Aperture Radar Using Ground Test Data;2023 IEEE Microwaves, Antennas, and Propagation Conference (MAPCON);2023-12-11

2. Impact of Sacbrood Virus on Larval Microbiome of Apis mellifera and Apis cerana;Insects;2020-07-13

3. Semiconductor device reliability in extreme high temperature space environments;2001 IEEE Aerospace Conference Proceedings (Cat. No.01TH8542)

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