Nonlinear and symbolic data dependence testing
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Signal Processing
Link
http://xplorestaging.ieee.org/ielx4/71/15917/00737695.pdf?arnumber=737695
Cited by 36 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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3. K-DT: a formal system for the evaluation of linear data dependence testing techniques;The Journal of Supercomputing;2017-11-15
4. A Survey of Loop Parallelization: Models, Approaches, and Recent Developments;International Journal of Grid and Distributed Computing;2016-11-30
5. The Accuracy of the Non-continuous I Test for One-Dimensional Arrays with References Created by Induction Variables;Journal of Information Processing Systems;2014-12-31
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