Sequential Bayesian Planning for Accelerated Degradation Tests Considering Sensor Degradation
Author:
Affiliation:
1. Department of Advanced Design and Systems Engineering, The City University of Hong Kong, Hong Kong
2. School of Mathematics and Statistics, The University of Sydney, Sydney, NSW, Australia
Funder
National Natural Science Foundation of China
Council of Hong Kong
Hong Kong Innovation and Technology Commission
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx7/24/4378406/09972839.pdf?arnumber=9972839
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