K-means Clustering with ANN based Classification to Predict Current-Voltage Characteristics of Advanced FETs
Author:
Affiliation:
1. Electrical Engineering IIT Gandhinagar,Gandhinagar,Gujarat
2. Pandit Deendayal Energy University,Computer Science and Engineering,Gandhinagar,Gujarat
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10483275/10483296/10483454.pdf?arnumber=10483454
Reference14 articles.
1. A Physical-Based Artificial Neural Networks Compact Modeling Framework for Emerging FETs
2. Deep-Learning-Assisted Physics-Driven MOSFET Current-Voltage Modeling
3. Artificial Neural Network-Based Compact Modeling Methodology for Advanced Transistors
4. Physics-Inspired Neural Networks for Efficient Device Compact Modeling
5. Prediction of FinFET Current-Voltage and Capacitance-Voltage Curves Using Machine Learning With Autoencoder
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