Squeeze-and-Excitation Wide Residual Networks in Image Classification-Reference-Cited by-同舟云学术

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Squeeze-and-Excitation Wide Residual Networks in Image Classification

Published:2019-09 Issue: Volume: Page:
ISSN:
Container-title:2019 IEEE International Conference on Image Processing (ICIP)
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Author:

Zhong Xian,Gong Oubo,Huang Wenxin,Li Lin,Xia Hongxia

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8791230/8799366/08803000.pdf?arnumber=8803000

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