Dynamic SEE Testing of Selected Architectural Features of Xilinx 28 nm Virtex-7 FPGAs-Reference-Cited by-同舟云学术

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Dynamic SEE Testing of Selected Architectural Features of Xilinx 28 nm Virtex-7 FPGAs

Published:2017-10 Issue: Volume: Page:
ISSN:
Container-title:2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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Author:

Swift Gary M.,Stone Stephen E.,Garcia Sebastian E.,Wray Kevin W.,Rowe William J.,Pfau Krysten H.,Liu Robert,Holden Jonathan,Angeles Asa,Willits Barry L.,Robinson Kyle P.,Perez-Celis Andres,Wirthlin Michael J.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8691548/8696098/08696210.pdf?arnumber=8696210

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Soft-core processor integration based on different instruction set architectures and field programmable gate array custom datapath implementation;PeerJ Computer Science;2023-04-18

2. Differences in MBUs induced by high-energy and medium-energy heavy ions in 28 nm FPGAs;Nuclear Science and Techniques;2022-09

3. Bridging RHA Methodology From Component to System Level Applied to System-on-Modules;IEEE Transactions on Nuclear Science;2022-07

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