Author:
D'Alessio M.,Poivey C.,Walter D.,Gruermann K.,Gliem F.,Schmidt H.,Sorensen R. Harboe,Keating A.,Fleurinck N.,Puimege K.,Gerrits D.,Mathijs P.
Cited by
2 articles.
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1. Proposal of a Multiscale High Accuracy Engineering Approach for Single-Event Effects Analysis in Modern Technologies;IEEE Transactions on Nuclear Science;2024-08
2. Low-energy proton-induced single event effect in NAND flash memories;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2020-07