Simulation and test results of a slim edge planar p-on-n sensor for FEL applications-Reference-Cited by-同舟云学术

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Simulation and test results of a slim edge planar p-on-n sensor for FEL applications

Published:2021-10-27 Issue: Volume: Page:
ISSN:
Container-title:2021 International Conference on Engineering and Emerging Technologies (ICEET)
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Author:

el Amine Benkechkache Mohamed,Dalla Betta Gian-Franco,Pancheri Lucio,Latreche Saida,Ghoualmi Lamis

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9659488/9659490/09659633.pdf?arnumber=9659633

Reference18 articles.

1. Design and First Tests of a Radiation-Hard Pixel Sensor for the European X-Ray Free-Electron Laser

2. Requirements for and development of 2 dimensional X-ray detectors for the European X-ray Free Electron Laser in Hamburg

3. A 2D imager for X-ray FELs with a 65 nm CMOS readout based on per-pixel signal compression and 10 bit A/D conversion

4. Processing and characterization of edgeless radiation detectors for large area detection

5. Edgeless silicon sensors for Medipix-based large-area X-ray imaging detectors

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. TCAD simulation of charge collection properties of an active edge planar p-on-n sensor for FEL applications;2021 Fourth International Conference on Microelectronics, Signals & Systems (ICMSS);2021-11-18

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