Field and temperature acceleration model for time-dependent dielectric breakdown-Reference-Cited by-同舟云学术

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Field and temperature acceleration model for time-dependent dielectric breakdown

Published:1999 Issue:1 Volume:46 Page:220-229
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Kimura M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx4/16/15902/00737462.pdf?arnumber=737462

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