New Real-Time Fluence Correction Method With SRAM Dosimeter for High Accuracy Single-Event Upset Evaluation
Author:
Affiliation:
1. Quality Reliability Technology (QRT) Inc., Yeongtong-gu, Suwon-si, Gyeonggi-do, Republic of Korea
2. Los Alamos Neutron Science Center (LANSCE), Los Alamos, NM, USA
Funder
Next Generation Intelligent Semiconductor Technology Development Project of the Korea Evaluation Institute of Industrial Technology (KEIT) through the Korean Government
Ministry of Trade and Industry Energy
Development of Commercialization Equipment to Detect Semiconductor Soft Error by Neutron
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Link
http://xplorestaging.ieee.org/ielx7/23/10129064/10099467.pdf?arnumber=10099467
Reference20 articles.
1. State-of-the-Art Flash Chips for Dosimetry Applications
2. Extreme Value Analysis in Flash Memories for Dosimetry Applications
3. Analysis of Turbo Decoder Robustness Against SEU Effects
4. Neutron Dosimeter Using a Dynamic Random Access Memory as a Sensor
5. Stuck Bits Study in DDR3 SDRAMs Using 45-MeV Proton Beam
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Evaluation of Neutron Radiation Impact for 1200-V Class 4H-SiC MOSFET at Gate Switching Mode With TCAD Simulation;IEEE Transactions on Nuclear Science;2023-08
2. Analysis of Efficiency and Utilization with SRAM Dosimetry for Single-Event Effect Evaluation under Irradiation;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03
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