The Use of High-Energy X-Ray Generators for TID Testing of Electronic Devices-Reference-Cited by-同舟云学术

The Use of High-Energy X-Ray Generators for TID Testing of Electronic Devices

Published:2023-08 Issue:8 Volume:70 Page:1982-1989
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Girones Vincent¹^ORCID,Boch Jérôme¹^ORCID,Carapelle Alain²^ORCID,Chapon Arnaud³,Maraine Tadec¹,Labau Timothee¹,Saigné Frédéric¹,Alía Rubén García⁴^ORCID

Affiliation:

1. UM, UMR UM/CNRS 5214, Université de Montpellier, Montpellier, France

2. Centre Spatial de Liège (CSL), Angleur, Liège, Belgium

3. ATRON METROLOGY, Cherbourg-en-Cotentin, France

4. European Organization for Nuclear Research (CERN), Genève, Switzerland

Funder

EU Project RADNEXT through the European Union’s Horizon 2020 Research and Innovation Program

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/10221199/10136833.pdf?arnumber=10136833

Reference22 articles.

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2. Tungsten anode spectral model using interpolating cubic splines: Unfiltered x-ray spectra from 20 kV to 640 kV

3. Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays

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