Author:
Papadopoulou Alexia,Makris Nikolaos,Chevas Loukas,Nikolaou Aristeidis,Bucher Matthias
Cited by
2 articles.
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1. Total Ionizing Dose (TID) Impact on Basic Amplifier Stages;IEEE Transactions on Device and Materials Reliability;2023-03
2. The Circuit Technique for Reducing the Zero Level of the JFET Op-Amp on the Push-Pull Folded-Cascode;2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON);2022-11-11