Author:
Dey S.,Dash T. P.,Das S.,Mohapatra E.,Jena J.,Maiti C. K.
Cited by
3 articles.
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1. Comparative Study of Nanowire FET & Internal Gate Nanowire FET;2024 2nd International Conference on Device Intelligence, Computing and Communication Technologies (DICCT);2024-03-15
2. A Study on influence of geometric parameters in Gate All Around Transistors;2023 2nd International Conference on Advancements in Electrical, Electronics, Communication, Computing and Automation (ICAECA);2023-06-16
3. Performance Analysis of the Gate All Around Nanowire FET with Group III–V Compound Channel Materials and High-k Gate Oxides;Transactions on Electrical and Electronic Materials;2023-05-12