Author:
Privat Aymeric,Clark Lawrence T.
Cited by
9 articles.
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1. Modeling of Bias-Dependent Single Event Transients for Circuit Sensitivity Calculation;2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS);2023-08-06
2. TCAD Calibrated SEE Fault Model Validated with Beam Results for a 12nm D Flip-Flop.;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03
3. Self-correcting Flip-flops for Triple Modular Redundant Logic in a 12-nm Technology;2022 IEEE International Symposium on Circuits and Systems (ISCAS);2022-05-28
4. LET-dependent model of single-event effects in MOSFETs;Journal of Computational Electronics;2021-05-09
5. On the importance of bias-dependent charge injection for SET evaluation in AMS Circuits;2020 18th IEEE International New Circuits and Systems Conference (NEWCAS);2020-06