Reconfigurable ECC for adaptive protection of memory
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/6653322/6674559/06674841.pdf?arnumber=6674841
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. ASCH-PUF: A “Zero” Bit Error Rate CMOS Physically Unclonable Function With Dual-Mode Low-Cost Stabilization;IEEE Journal of Solid-State Circuits;2023-07
2. E3C Techniques for Protecting NAND Flash Memories;Journal of Electronic Testing;2023-07-01
3. Fine-Grained Built-In Self-Repair Techniques for NAND Flash Memories;2022 IEEE International Test Conference (ITC);2022-09
4. A Multimode Configurable Physically Unclonable Function With Bit-Instability-Screening and Power-Gating Strategies;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-01
5. Fault-Aware Dependability Enhancement Techniques for Flash Memories;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2020-03
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