Probabilistic simulation for reliability analysis of CMOS VLSI circuits-Reference-Cited by-同舟云学术

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Probabilistic simulation for reliability analysis of CMOS VLSI circuits

Published:1990-04 Issue:4 Volume:9 Page:439-450
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Najm F.N.,Burch R.,Yang P.,Hajj I.N.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx1/43/1733/00045875.pdf?arnumber=45875

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