Noise characterization of sub-10-fs Ti:sapphire oscillators-Reference-Cited by-同舟云学术

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Noise characterization of sub-10-fs Ti:sapphire oscillators

Published:1998 Issue:2 Volume:4 Page:179-184
ISSN:1077-260X
Container-title:IEEE Journal of Selected Topics in Quantum Electronics
language:
Short-container-title:IEEE J. Select. Topics Quantum Electron.

Author:

Poppe A.,Xu L.,Krausz F.,Spielmann C.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics

Link

http://xplorestaging.ieee.org/ielx4/2944/15065/00686721.pdf?arnumber=686721

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