Intermetallic growth on PWBs soldered with Sn3.8Ag0.7Cu

Author:

Zheng Y.,Hillman C.,McCluskey P.

Publisher

IEEE

Cited by 23 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Impact of Surface Finish, Solder Volume and Solder Composition on the Grain Structure of SnAgCu Solder Joints;2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC);2020-09-15

2. Bonding Properties of Ribbon/Silicon Cell Joints Obtained by Infrared Lamp Soldering;Journal of Nanoelectronics and Optoelectronics;2018-12-12

3. Microstructure and Shear Strength of Low-Silver SAC/Cu Solder Joints during Aging;MATERIALS TRANSACTIONS;2016

4. Interfacial Reactions and Electromigration in Flip-Chip Solder Joints;Advanced Flip Chip Packaging;2013

5. Impact of Black Pad and Intermetallic Layers on the Risk for Fractures in Solder Joints to Electroless Nickel/Immersion Gold;The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects;2011

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