Design Challenges and Solutions of Emerging Nonvolatile Memory for Embedded Applications
Author:
Affiliation:
1. TSMC,Hsinchu,Taiwan,300
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9720433/9720494/09720557.pdf?arnumber=9720557
Reference10 articles.
1. A N22 96KX144 RRAM macro with self-track write-verify scheme and low ripple charge pump for configurable read window;chou;VLSI,0
2. MRAM as Embedded Non-Volatile Memory Solution for 22FFL FinFET Technology;glowinski;IEDM,0
3. Review and Outlook on Embedded NVM Technologies – From Evolution to Revolution
4. logic process compatible 40nm 256Kx144 Embedded RRAM with low voltage current limiter and ambient compensation scheme to improve the read window;lai;ASSCC,0
5. A 1.4Mb 40-nm embedded ReRAM macro with 0.07um2 bit cell, 2.7mA/100MHz low-power read and hybrid write verify for high endurance application
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