Benefits of Integrated-Circuit Burn-In to Obtain High Reliability Parts

Author:

Pantic Dragan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Analog/RF Circuit Aging Prediction based on On-Chip Machine Learning;2023 6th International Conference on Artificial Intelligence and Big Data (ICAIBD);2023-05-26

2. Machine Learning Support for Board-Level Functional Fault Diagnosis;Machine Learning Support for Fault Diagnosis of System-on-Chip;2022-10-22

3. Real-Time Prediction for IC Aging Based on Machine Learning;IEEE Transactions on Instrumentation and Measurement;2019-12

4. Recycled IC Detection Based on Statistical Methods;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2015-06

5. Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain;Proceedings of the IEEE;2014-08

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