Reliability of Consecutive-k-out-of-n:F Systems with (k-1)-step Markov Dependence
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx5/24/4335516/04335561.pdf?arnumber=4335561
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