Semantic Integrity Measurement of Industrial Control Embedded Devices Based on National Secret Algorithm-Reference-Cited by-同舟云学术

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Semantic Integrity Measurement of Industrial Control Embedded Devices Based on National Secret Algorithm

Published:2023-08-10 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE/CIC International Conference on Communications in China (ICCC Workshops)
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Author:

Zhang Xiao¹,Qi Longyun²,Ma Xiaolei³,Liu Wei²,Sun Lianwen²,Li Xiangnan²,Duan Binbin⁴,Zhang Siyuan⁴,Che Xin⁴

Affiliation:

1. State Grid Corporation of China,Beijing,China,100031

2. NARI Group Corporation/State Grid Electric Power Research Institute,Nanjing,China,210003

3. State Grid Xinjiang Electric Power Co., Ltd.

4. Zhejiang University,State Key Lab. of Industrial Control Technology,Hangzhou,P. R. China,310027

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10233259/10233263/10233798.pdf?arnumber=10233798

Reference21 articles.

1. OB-IMA: out-of-the-box integrity measurement approach for guest virtual machines

2. HyperSentry

3. Remote attestation and integrity measurements with Intel SGX for virtual machines

4. Dynamic integrity measurement model based on vTPM

5. Remote Non-Intrusive Malware Detection for PLCs based on Chain of Trust Rooted in Hardware

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